Probe Measurements with Multi-Pin System in ICRF Plasma Device

Local TagsRelease HistoryDetailsSummary

Probe Measurements with Multi-Pin System in ICRF Plasma Device

Morel, J. (2016). Probe Measurements with Multi-Pin System in ICRF Plasma Device. Bachelor Thesis, Ghent University, Ghent.

Item is Released

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-7A02-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-7A03-B

Genre: Thesis

show

show

hide

Creators:
Morel, J.¹, Author

Affiliations:
1Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856321

show

show

hide

Language(s): eng - English

Dates: Accepted: 2016Date issued: 2016

Publication Status: Issued

Pages: 90 p.

Publishing info: Ghent : Ghent University

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: Bachelor

show

show

show

show