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  Intrinsic emittance and coherence of double-gate field emitter arrays

Tsujino, S., Kanungo, P. D., Monshipouri, M., Lee, C., Yamada, T., Kassier, G., et al. (2016). Intrinsic emittance and coherence of double-gate field emitter arrays. In Technical Digest, 29th International Vacuum Nanoelectronics Conference (IVNC 2016). IEEE. doi:10.1109/IVNC.2016.7551472.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-840F-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-8410-4
Genre: Conference Paper

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Locator:
http://dx.doi.org/10.1109/IVNC.2016.7551472 (Publisher version)
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 Creators:
Tsujino, S.1, Author
Kanungo, P. Das1, Author
Monshipouri, M.1, Author
Lee, C.1, Author
Yamada, T.2, Author
Kassier, Günther3, Author           
Miller, R. J. Dwayne3, Author           
Affiliations:
1Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, Villigen-PSI, Switzerland, ou_persistent22              
2National Institute of Advanced, Industrial Science and Technology, Higashi Tsukuba, Ibaraki, Japan, ou_persistent22              
3Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_1938288              

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Free keywords: Diffraction; Coherence; Laser beams; Cathodes; Graphene; Field emitter arrays; Logic gates
 Abstract: The intrinsic transverse emittance and coherence of double-gate field emitter array cathodes were explored experimentally including the low-energy electron diffraction and compared with theory.

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Language(s): eng - English
 Dates: 2016-08-25
 Publication Status: Published online
 Pages: 2
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: DOI: 10.1109/IVNC.2016.7551472
 Degree: -

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Title: 29th International Vacuum Nanoelectronics Conference (IVNC 2016)
Place of Event: University of British Columbia, Vancouver, Canada
Start-/End Date: 2016-07-11 - 2016-07-15

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Title: Technical Digest, 29th International Vacuum Nanoelectronics Conference (IVNC 2016)
Source Genre: Proceedings
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Affiliations:
Publ. Info: IEEE
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: ISSN: 978-1-5090-2419-3