Atom probe tomography study of the phase change material GeTeSe

Schwarz, Torsten; Gault, Baptiste; Zhang, Siyuan; Cagnoni, Matteo; Cojocaru-Mirédin, Oana; Wuttig, Matthias

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Atom probe tomography study of the phase change material GeTeSe

Schwarz, T., Gault, B., Zhang, S., Cagnoni, M., Cojocaru-Mirédin, O., & Wuttig, M. (2016). Atom probe tomography study of the phase change material GeTeSe. Talk presented at Atom Probe Tomography & Microscopy (APT&M). Gyeongju, South Korea. 2016-06-12 - 2016-06-17.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-B7D2-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-B7D3-A

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Creators:
Schwarz, Torsten^{1, 2}, Author
Gault, Baptiste¹, Author
Zhang, Siyuan³, Author
Cagnoni, Matteo⁴, Author
Cojocaru-Mirédin, Oana^{1, 2}, Author
Wuttig, Matthias⁴, Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2RWTH Aachen University, I. Physikalisches Institut IA, 52056 Aachen, Germany , ou_persistent22
3 Nanoanalytik und Grenzflächen, Max-Planck-Institut für Eisenforschung , ou_persistent22
4RWTH Aachen University, I. Physikalisches Institut IA, 52056 Aachen, Germany, ou_persistent22

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Language(s): eng - English

Dates: Created: 2016-06

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Title: Atom Probe Tomography & Microscopy (APT&M)

Place of Event: Gyeongju, South Korea

Start-/End Date: 2016-06-12 - 2016-06-17

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