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  Transverse and longitudinal characterization of electron beams using interaction with optical near-fields

Kozak, M., McNeur, J., Leedle, K. J., Deng, H., Schoenenberger, N., Ruehl, A., et al. (2016). Transverse and longitudinal characterization of electron beams using interaction with optical near-fields. OPTICS LETTERS, 41(15), 3435-3438. doi:10.1364/OL.41.003435.

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 Creators:
Kozak, Martin1, Author
McNeur, Joshua1, Author
Leedle, Kenneth J.1, Author
Deng, Huiyang1, Author
Schoenenberger, Norbert1, Author
Ruehl, Axel1, Author
Hartl, Ingmar1, Author
Hoogland, Heinar1, Author
Holzwarth, Ronald1, Author
Harris, James S.1, Author
Byer, Robert L.1, Author
Hommelhoff, Peter2, Author           
Affiliations:
1external, ou_persistent22              
2Hommelhoff Group, Associated Groups, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364693              

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Free keywords: FEMTOSECOND; DIFFRACTION; ACCELERATION; PULSESOptics;
 Abstract: We demonstrate an experimental technique for both transverse and longitudinal characterization of bunched femtosecond free electron beams. The operation principle is based on monitoring of the current of electrons that obtained an energy gain during the interaction with the synchronized optical near-field wave excited by femtosecond laser pulses. The synchronous accelerating/decelerating fields confined to the surface of a silicon nanostructure are characterized using a highly focused sub-relativistic electron beam. Here the transverse spatial resolution of 450 nm and femtosecond temporal resolution of 480 fs (sub-optical-cycle temporal regime is briefly discussed) achievable by this technique are demonstrated. (C) 2016 Optical Society of America

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Language(s): eng - English
 Dates: 2016
 Publication Status: Issued
 Pages: 4
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: 000381014400012
DOI: 10.1364/OL.41.003435
 Degree: -

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Title: OPTICS LETTERS
Source Genre: Journal
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Publ. Info: 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA : OPTICAL SOC AMER
Pages: - Volume / Issue: 41 (15) Sequence Number: - Start / End Page: 3435 - 3438 Identifier: ISSN: 0146-9592