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  Modeling the dielectric function of degenerately doped ZnO: Al thin films grown by ALD using physical parameters

Latzel, M., Goebelt, M., Broenstrup, G., Venzago, C., Schmitt, S. W., Sarau, G., et al. (2015). Modeling the dielectric function of degenerately doped ZnO: Al thin films grown by ALD using physical parameters. OPTICAL MATERIALS EXPRESS, 5(9), 1979-1990. doi:10.1364/OME.5.001979.

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 Creators:
Latzel, Michael1, Author           
Goebelt, Manuela2, Author           
Broenstrup, Gerald1, Author           
Venzago, Cornel3, Author
Schmitt, Sebastian W.1, Author           
Sarau, George1, Author           
Christiansen, Silke H.1, 2, Author           
Affiliations:
1Micro- & Nanostructuring, Technology Development and Service Units, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364725              
2Christiansen Research Group, Research Groups, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364716              
3external, ou_persistent22              

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Free keywords: VOLTAIC ENERGY-CONVERSION; MIS TUNNEL-DIODES; SOLAR-CELLS; OXIDE-FILMS; SEMICONDUCTORS; TRANSPARENT; CONSTANTS; BANDMaterials Science; Optics;
 Abstract: Transparent conductive thin films are a key building block of modern optoelectronic devices. A promising alternative to expensive indium containing oxides is aluminum doped zinc oxide (AZO). By correlating spectroscopic ellipsometry and photoluminescence, we analyzed the contributions of different optical transitions in AZO grown by atomic layer deposition to a model dielectric function (MDF) over a wide range of photon energies. The derived MDF reflects the effects of the actual band structure and therefore describes the optical properties very accurately. The presented MDF is solely based on physically meaningful parameters in contrast to empirical models like e.g. the widely used Sellmeier equation, but nevertheless real and imaginary parts are expressed as closed-form expressions. We analyzed the influence of the position of the Fermi energy and the Fermi-edge singularity to the different parts of the MDF. This information is relevant for design and simulation of optoelectronic devices and can be determined by analyzing the results from spectroscopic ellipsometry. (C) 2015 Optical Society of America

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Language(s): eng - English
 Dates: 2015
 Publication Status: Issued
 Pages: 12
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: 000360810500010
DOI: 10.1364/OME.5.001979
 Degree: -

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Title: OPTICAL MATERIALS EXPRESS
Source Genre: Journal
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Publ. Info: 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA : OPTICAL SOC AMER
Pages: - Volume / Issue: 5 (9) Sequence Number: - Start / End Page: 1979 - 1990 Identifier: ISSN: 2159-3930