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  Modeling the dielectric function of degenerately doped ZnO: Al thin films grown by ALD using physical parameters

Latzel, M., Goebelt, M., Broenstrup, G., Venzago, C., Schmitt, S. W., Sarau, G., et al. (2015). Modeling the dielectric function of degenerately doped ZnO: Al thin films grown by ALD using physical parameters. OPTICAL MATERIALS EXPRESS, 5(9), 1979-1990. doi:10.1364/OME.5.001979.

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Latzel, Michael1, Autor           
Goebelt, Manuela2, Autor           
Broenstrup, Gerald1, Autor           
Venzago, Cornel3, Autor
Schmitt, Sebastian W.1, Autor           
Sarau, George1, Autor           
Christiansen, Silke H.1, 2, Autor           
Affiliations:
1Micro- & Nanostructuring, Technology Development and Service Units, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364725              
2Christiansen Research Group, Research Groups, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364716              
3external, ou_persistent22              

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Schlagwörter: VOLTAIC ENERGY-CONVERSION; MIS TUNNEL-DIODES; SOLAR-CELLS; OXIDE-FILMS; SEMICONDUCTORS; TRANSPARENT; CONSTANTS; BANDMaterials Science; Optics;
 Zusammenfassung: Transparent conductive thin films are a key building block of modern optoelectronic devices. A promising alternative to expensive indium containing oxides is aluminum doped zinc oxide (AZO). By correlating spectroscopic ellipsometry and photoluminescence, we analyzed the contributions of different optical transitions in AZO grown by atomic layer deposition to a model dielectric function (MDF) over a wide range of photon energies. The derived MDF reflects the effects of the actual band structure and therefore describes the optical properties very accurately. The presented MDF is solely based on physically meaningful parameters in contrast to empirical models like e.g. the widely used Sellmeier equation, but nevertheless real and imaginary parts are expressed as closed-form expressions. We analyzed the influence of the position of the Fermi energy and the Fermi-edge singularity to the different parts of the MDF. This information is relevant for design and simulation of optoelectronic devices and can be determined by analyzing the results from spectroscopic ellipsometry. (C) 2015 Optical Society of America

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Sprache(n): eng - English
 Datum: 2015
 Publikationsstatus: Erschienen
 Seiten: 12
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: ISI: 000360810500010
DOI: 10.1364/OME.5.001979
 Art des Abschluß: -

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Titel: OPTICAL MATERIALS EXPRESS
Genre der Quelle: Zeitschrift
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA : OPTICAL SOC AMER
Seiten: - Band / Heft: 5 (9) Artikelnummer: - Start- / Endseite: 1979 - 1990 Identifikator: ISSN: 2159-3930