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  Reduction of phase singularities in speckle-shearing interferometry by incoherent averaging of speckle patterns

Mantel, K., Nercissian, V., & Lindlein, N. (2015). Reduction of phase singularities in speckle-shearing interferometry by incoherent averaging of speckle patterns. In OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION IX. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA: SPIE-INT SOC OPTICAL ENGINEERING. doi:10.1117/12.2184580.

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 Urheber:
Mantel, K.1, Autor           
Nercissian, Vanusch1, Autor           
Lindlein, N.1, Autor           
Affiliations:
1Optical Design and Microoptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364704              

Inhalt

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Schlagwörter: Instruments & Instrumentation; Optics; Physics; Speckle-shearing interferometry; phase singularities; incoherent averaging;
 Zusammenfassung: Speckle interferometry is a well established technique for the optical characterization of rough objects, with the quantification of deformations as one particular application of interest. Owing to its common path property, a speckle-shearing interferometer is often the natural choice as a setup. Like other speckle techniques, however, speckle-shearing interferometry suffers from the existence of phase singularities present in the speckle patterns. Phase singularities introduce ambiguities into the phase unwrapping process and make this evaluation step highly sophisticated. In this work, we attempt to reduce the number of phase singularities by physical means, i. e. by applying an incoherent averaging of multiple, mutually independent speckle intensities. The effect of the incoherent averaging on the number of phase singularities has been investigated theoretically, by computer simulations, and experimentally To obtain high contrast fringes in connection with a shearing setup, which would not be the case for a simple extended light source, a periodically structured light source with a period matched to the shear distance is applied. It turns out that the number of phase singularities may indeed be reduced, but only to a certain extent.

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Sprache(n): eng - English
 Datum: 2015
 Publikationsstatus: Online veröffentlicht
 Seiten: 7
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: ISI: 000357981400024
DOI: 10.1117/12.2184580
 Art des Abschluß: -

Veranstaltung

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Titel: Conference on Optical Measurement Systems for Industrial Inspection IX
Veranstaltungsort: Munich, GERMANY
Start-/Enddatum: 2015-06-22 - 2015-06-25

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Titel: OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION IX
  Alternativer Titel : PROC SPIE
Genre der Quelle: Konferenzband
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA : SPIE-INT SOC OPTICAL ENGINEERING
Seiten: SPIE Band / Heft: - Artikelnummer: 95250U Start- / Endseite: - Identifikator: ISSN: 0277-786X
ISBN: 978-1-62841-685-5

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Titel: Proceedings of SPIE
  Alternativer Titel : PROC SPIE
Genre der Quelle: Reihe
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Affiliations:
Ort, Verlag, Ausgabe: -
Seiten: - Band / Heft: 9525 Artikelnummer: - Start- / Endseite: - Identifikator: ISSN: 0277-786X