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  Nanowire Arrays in Multicrystalline Silicon Thin Films on Glass: A Promising Material for Research and Applications in Nanotechnology

Schmitt, S. W., Schechtel, F., Amkreutz, D., Bashouti, M., Srivastava, S. K., Hoffmann, B., et al. (2012). Nanowire Arrays in Multicrystalline Silicon Thin Films on Glass: A Promising Material for Research and Applications in Nanotechnology. NANO LETTERS, 12(8), 4050-4054. doi:10.1021/nl301419q.

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 Creators:
Schmitt, Sebastian W.1, Author           
Schechtel, Florian2, Author
Amkreutz, Daniel2, Author
Bashouti, Muhammad1, Author           
Srivastava, Sanjay K.2, Author
Hoffmann, Bjoern1, Author           
Dieker, Christel2, Author
Spiecker, Erdmann2, Author
Rech, Bernd2, Author
Christiansen, Silke H.1, 3, Author           
Affiliations:
1Micro- & Nanostructuring, Technology Development and Service Units, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364725              
2external, ou_persistent22              
3Christiansen Research Group, Research Groups, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364716              

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Free keywords: SOLAR-CELLS; PHOTOVOLTAIC APPLICATIONS; OPTICAL-PROPERTIES; ABSORPTION; DEVICES; GROWTHChemistry; Science & Technology - Other Topics; Materials Science; Physics; Silicon nanowires; multicrystalline; silicon thin film on glass; e-beam crystallization; photovoltaics; absorption; reactive ion etching; EBSD; TEM; XPS;
 Abstract: Silicon nanowires (SiNW) were formed on large grained, electron-beam crystallized silicon (Si) thin films of only 6 pm thickness on glass using nanosphere lithography (NSL) in combination with reactive ion etching (RIE). Electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM) studies revealed outstanding structural properties of this nanomaterial. It could be shown that SiNWs with entirely predetermined shapes including lengths, diameters and spacings and straight side walls form independently of their crystalline orientation and arrange in ordered arrays on glass. Furthermore, for the first time grain boundaries could be observed in individual, straightly etched SiNWs. After heat treatment an electronic grade surface quality of the SiNWs could be shown by X-ray photoelectron spectroscopy (XPS). Integrating sphere measurements show that SiNW patterning of the multicrystalline Si (mc-Si) starting thin film on glass substantially increases absorption and reduces reflection, as being desired for an application in thin film photovoltaics (PV). The multicrystalline SiNWs directly mark a starting point for research not only in PV but also in other areas like nanoelectronics, surface functionalization, and nanomechanics.

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Language(s): eng - English
 Dates: 2012
 Publication Status: Issued
 Pages: 5
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: 000307211000029
DOI: 10.1021/nl301419q
 Degree: -

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Title: NANO LETTERS
Source Genre: Journal
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Publ. Info: 1155 16TH ST, NW, WASHINGTON, DC 20036 USA : AMER CHEMICAL SOC
Pages: - Volume / Issue: 12 (8) Sequence Number: - Start / End Page: 4050 - 4054 Identifier: ISSN: 1530-6984