Absolute frequency measurement of the molecular iodine hyperfine components 
near 560 nm with a solid-state laser source

Zhang, J.; Lu, Z. H.; Wang, L. J.

doi:10.1364/AO.48.005629

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Absolute frequency measurement of the molecular iodine hyperfine components near 560 nm with a solid-state laser source

Zhang, J., Lu, Z. H., & Wang, L. J. (2009). Absolute frequency measurement of the molecular iodine hyperfine components near 560 nm with a solid-state laser source. APPLIED OPTICS, 48(29), 5629-5635. doi:10.1364/AO.48.005629.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-6BA9-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-6BAA-4

Genre: Journal Article

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Creators:
Zhang, J.¹, Author
Lu, Z. H.², Author
Wang, L. J.², Author

Affiliations:
1external, ou_persistent22
2Max Planck Fellow Group, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364711

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Free keywords: INCLUDING RECOMMENDED RADIATIONS; PRACTICAL REALIZATION; DIODE-LASER; I-127(2); LINES; SPECTROSCOPY; SPECTRUM; STANDARD; METER; TRANSITIONSOptics;

Abstract: We report absolute frequency measurements of the molecular iodine R(34) 20-0 a(1), a(10), and a(15) hyperfine transitions, and the P(144) 23-0 a(1) hyperfine transition at 560 nm with a frequency comb. The light source is based on an all-solid-state frequency quadrupled laser system. A frequency stability of 4 x 10(-12) is achieved over a 100 s integration time when the light source is frequency stabilized to the R(34) 20-0 a(1) line. The pressure and power broadening dependences of the R(34) 20-0 a(10) line are also investigated. (C) 2009 Optical Society of America

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Language(s): eng - English

Dates: Date issued: 2009

Publication Status: Issued

Pages: 7

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Table of Contents: -

Rev. Type: -

Identifiers: ISI: 000270667800027
DOI: 10.1364/AO.48.005629

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Title: APPLIED OPTICS

Source Genre: Journal

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Publ. Info: 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA : OPTICAL SOC AMER

Pages: - Volume / Issue: 48 (29) Sequence Number: - Start / End Page: 5629 - 5635 Identifier: ISSN: 1559-128X