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Schlagwörter:
METAMATERIALS; DISPLACEMENT; BEAMOptics;
Zusammenfassung:
We report a precise direct measurement of the Goos-Hanchen shift after one reflection off a dielectric interface coated with periodic metal stripes. The spatial displacement of the shift is determined by image analysis. A maximal absolute shift of 5.18 and 23.39 mu m for TE and TM polarized light, respectively, is determined. This technique is simple to implement and can be used for a large range of incident angles. (C) 2008 Optical Society of America.