日本語
 
Help Privacy Policy ポリシー/免責事項
  詳細検索ブラウズ

アイテム詳細

登録内容を編集ファイル形式で保存
 
 
ダウンロード電子メール
  Characterization of cylindrical micro-lenses in transmitted light and with grazing incidence interferometry in reflected light

Lamprecht, J., Lindlein, N., & Schwider, J. (2006). Characterization of cylindrical micro-lenses in transmitted light and with grazing incidence interferometry in reflected light. In OPTICAL MICRO- AND NANOMETROLOGY IN MICROSYSTEMS TECHNOLOGY. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA: SPIE-INT SOC OPTICAL ENGINEERING. doi:10.1117/12.662691.

Item is

基本情報

表示: 非表示:
資料種別: 会議論文

ファイル

表示: ファイル

関連URL

表示:

作成者

表示:
非表示:
 作成者:
Lamprecht, Juergen1, 著者
Lindlein, Norbert2, 著者           
Schwider, Johannes2, 著者           
所属:
1external, ou_persistent22              
2Max Planck Research Group, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364712              

内容説明

表示:
非表示:
キーワード: SURFACESScience & Technology - Other Topics; Instruments & Instrumentation; Optics; phase shifting interferometry; null test; cylindrical micro lens; diffractive optics; grazing incidence;
 要旨: High numerical aperture cylindrical micro-lenses are needed in collimating the laser light from laser bars in the near infrared. Diffraction limited performance of such collimation lenses can only be obtained if the surface shape deviates strongly from circular symmetry. Therefore, null tests make the use of diffractive optical elements (DOE) necessary. For performance test at the design wavelength the reference DOE produces an ideal cylinder wave which enables the compensation of the wave front coming from the micro-lens to a plane wave. The use of a DOE-master enables beside the null test geometry also a removal of the anamorphic distortion due to the cylinder geometry. The DOEs having a numerical aperture of 0.8 are produced on an e-beam machine. The measurement of the wave aberrations is done with the help of the phase shifting technique. Alignment aberrations are eliminated by a least square fit of suitable misalignment functionals derived from an analytic approximation. The shape of the micro-lenses is tested in reflected light showing surface defects directly. The cylinder symmetry allows for a grazing incidence test using two DOE with nearly constant spatial frequency. There are no limitations concerning the test of high numerical aperture surfaces since the structure of the diffractive elements are parallel curves to the profile curve. The mean spatial frequency of the DOE defines the effective wavelength. Since we use a diffractive interferometer the effective wavelength is identical to the pitch of the DOE. Usually pitches between 4-10 mu m are used resulting in a fringe sensitivity of 2-5 mu m. The test delivers the deviation of the surface from the ideal form. In the case of non-circular symmetry the DOE deviates from the axicon type DOE. In addition to the shape deviations also the radius of curvature at the vertex can be measured. The stage for the cylindrical micro-lens is equipped with a length measuring device using grating references from Renishaw providing a length increment of 0.1 mu m. With the axicon DOE there are two positions where nearly fluffed out fringes can be observed. Starting from the basic test position the lens can be moved until the vertex of the lens coincides with the focal line of the wave generated by the central part of the DOE. The distance between these two positions gives the radius of curvature for the vertex. Modem manufacturing of micro-lenses comprises also hot embossing in plastics or even into glass. Because of the small dimensions of the lenses and the required accuracy of the surface shape also tests of the impressing mould have to be carried out. The DOE approach enables also the test of the embossing form with the same sensitivity as the final test of the lens. Measuring results for the two test methods will be given.

資料詳細

表示:
非表示:
言語: eng - English
 日付: 2006
 出版の状態: オンラインで出版済み
 ページ: 12
 出版情報: -
 目次: -
 査読: -
 識別子(DOI, ISBNなど): ISI: 000238886600040
DOI: 10.1117/12.662691
 学位: -

関連イベント

表示:
非表示:
イベント名: Conference on Optical Micro- and Nanometrology in Microsystems Technology
開催地: Strasbourg, FRANCE
開始日・終了日: 2006-04-05 - 2006-04-07

訴訟

表示:

Project information

表示:

出版物 1

表示:
非表示:
出版物名: OPTICAL MICRO- AND NANOMETROLOGY IN MICROSYSTEMS TECHNOLOGY
  出版物の別名 : PROC SPIE
種別: 会議論文集
 著者・編者:
所属:
出版社, 出版地: 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA : SPIE-INT SOC OPTICAL ENGINEERING
ページ: SPIE Europe, Conseil Gen Bas Rhin, Communaute Urbaine Strasbourg, Reg Alsace, Alsace Dev Agcy 巻号: - 通巻号: 618816 開始・終了ページ: - 識別子(ISBN, ISSN, DOIなど): ISSN: 0277-786X
ISBN: 0-8194-6244-6

出版物 2

表示:
非表示:
出版物名: Proceedings of SPIE
  出版物の別名 : PROC SPIE
種別: 連載記事
 著者・編者:
所属:
出版社, 出版地: -
ページ: - 巻号: 6188 通巻号: - 開始・終了ページ: - 識別子(ISBN, ISSN, DOIなど): ISSN: 0277-786X