Quality analysis of selective microparticle deposition on electrically 
programmable surfaces

Wagner, J.; Löffler, Felix; König, K.; Fernandez, S.; Nesterov-Müller, A.; Breitling, F.; Bischoff, F. R.; Stadler, V.; Hausmann, M.; Lindenstruth, V.

doi:10.1063/1.3456986

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Quality analysis of selective microparticle deposition on electrically programmable surfaces

Wagner, J., Löffler, F., König, K., Fernandez, S., Nesterov-Müller, A., Breitling, F., et al. (2010). Quality analysis of selective microparticle deposition on electrically programmable surfaces. Review of Scientific Instruments, 81(7): 073703. doi:10.1063/1.3456986.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002C-54D7-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002C-54D8-1

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Wagner, J., Author
Löffler, Felix¹, Author
König, K., Author
Fernandez, S., Author
Nesterov-Müller, A., Author
Breitling, F., Author
Bischoff, F. R., Author
Stadler, V., Author
Hausmann, M., Author
Lindenstruth, V., Author

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1External Organizations, ou_persistent22

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Dates: Date issued: 2010

Publication Status: Issued

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Identifiers: DOI: 10.1063/1.3456986
BibTex Citekey: doi:10.1063/1.3456986

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Title: Review of Scientific Instruments

Source Genre: Journal

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Publ. Info: Melville, NY : AIP Publishing

Pages: - Volume / Issue: 81 (7) Sequence Number: 073703 Start / End Page: - Identifier: ISSN: 0034-6748