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  Quality analysis of selective microparticle deposition on electrically programmable surfaces

Wagner, J., Löffler, F., König, K., Fernandez, S., Nesterov-Müller, A., Breitling, F., et al. (2010). Quality analysis of selective microparticle deposition on electrically programmable surfaces. Review of Scientific Instruments, 81(7): 073703. doi:10.1063/1.3456986.

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Wagner, J., Author
Löffler, Felix1, Author           
König, K., Author
Fernandez, S., Author
Nesterov-Müller, A., Author
Breitling, F., Author
Bischoff, F. R., Author
Stadler, V., Author
Hausmann, M., Author
Lindenstruth, V., Author
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1External Organizations, ou_persistent22              

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 Dates: 2010
 Publication Status: Published in print
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 Rev. Type: -
 Identifiers: DOI: 10.1063/1.3456986
BibTex Citekey: doi:10.1063/1.3456986
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Title: Review of Scientific Instruments
Source Genre: Journal
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Publ. Info: Melville, NY : AIP Publishing
Pages: - Volume / Issue: 81 (7) Sequence Number: 073703 Start / End Page: - Identifier: ISSN: 0034-6748