Robust Gaussian Filtering using a Pseudo Measurement

Wuethrich, Manuel; Garcia, Cifuentes Cristina; Trimpe, Sebastian; Meier, Franzi; Bohg, Jeannette; Issac, Jan; Schaal, Stefan

doi:10.1109/ACC.2016.7525473

Local TagsRelease HistoryDetailsSummary

Robust Gaussian Filtering using a Pseudo Measurement

Wuethrich, M., Garcia, C. C., Trimpe, S., Meier, F., Bohg, J., Issac, J., et al. (2016). Robust Gaussian Filtering using a Pseudo Measurement. In D. Abramovitch, & G. Chiu (Eds.), Proceedings of the American Control Conference (ACC 2016) (pp. 3606-3613). New York, NY, USA: IEEE. doi:10.1109/ACC.2016.7525473.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-1A24-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-418E-3

Genre: Conference Paper

Files

show Files

Locators

show

hide

Locator:
Link (Any fulltext) Open Access status unknown

Description:
-

OA-Status:

Creators

show

hide

Creators:
Wuethrich, Manuel¹, Author
Garcia, Cifuentes Cristina¹, Author
Trimpe, Sebastian¹, Author
Meier, Franzi¹, Author
Bohg, Jeannette¹, Author
Issac, Jan¹, Author
Schaal, Stefan¹, Author

Affiliations:
1Dept. Autonomous Motion, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497646

Content

show

hide

Free keywords: Abt. Schaal

Abstract: -

Details

show

hide

Language(s): eng - English

Dates: Published Online: 2016-07Date issued: 2016-08

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: BibTex Citekey: wuthrich-rgf-2015
DOI: 10.1109/ACC.2016.7525473

Degree: -

Event

show

hide

Title: American Control Conference (ACC 2016)

Place of Event: Boston, MA, USA

Start-/End Date: 2016-07-06 - 2016-07-08

Legal Case

show

Project information

show

Source 1

show

hide

Title: Proceedings of the American Control Conference (ACC 2016)

Source Genre: Proceedings

Creator(s):
Abramovitch, Danny¹, Editor
Chiu, George¹, Editor

Affiliations:
1 External Organizations, ou_persistent22

Publ. Info: New York, NY, USA : IEEE

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 3606 - 3613 Identifier: ISBN: 978-1-4673-8682-1
ISSN: 2378-5861