The metrology system of the VLTI instrument GRAVITY

Lippa, Magdalena; Gillessen, Stefan; Blind, Nicolas; Kok, Yitping; Yazıcı, Şenol; Weber, Johannes; Pfuhl, Oliver; Haug, Marcus; Kellner, Stefan; Wieprecht, Ekkehard; Eisenhauer, Frank; Genzel, Reinhard; Hans, Oliver; Haußmann, Frank; Huber, David; Kratschmann, Tobias; Ott, Thomas; Plattner, Markus; Rau, Christian; Sturm, Eckhard; Waisberg, Idel; Wiezorrek, Erich; Perrin, Guy; Perraut, Karine; Brandner, Wolfgang; Straubmeier, Christian; Amorim, Antonio

doi:10.1117/12.2232272

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The metrology system of the VLTI instrument GRAVITY

Lippa, M., Gillessen, S., Blind, N., Kok, Y., Yazıcı, Ş., Weber, J., et al. (2016). The metrology system of the VLTI instrument GRAVITY. In F. Malbet, M. J. Creech-Eakman, & P. G. Tuthill (Eds.), Optical and Infrared Interferometry and Imaging V (pp. 1-9).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002C-82F9-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002C-82FA-2

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Creators:
Lippa, Magdalena¹, Author
Gillessen, Stefan¹, Author
Blind, Nicolas, Author
Kok, Yitping, Author
Yazıcı, Şenol, Author
Weber, Johannes¹, Author
Pfuhl, Oliver¹, Author
Haug, Marcus¹, Author
Kellner, Stefan¹, Author
Wieprecht, Ekkehard¹, Author
Eisenhauer, Frank¹, Author
Genzel, Reinhard¹, Author
Hans, Oliver¹, Author
Haußmann, Frank¹, Author
Huber, David², Author
Kratschmann, Tobias², Author
Ott, Thomas¹, Author
Plattner, Markus², Author
Rau, Christian², Author
Sturm, Eckhard¹, Author
Waisberg, Idel¹, Author         Wiezorrek, Erich¹, Author         Perrin, Guy, AuthorPerraut, Karine, AuthorBrandner, Wolfgang, AuthorStraubmeier, Christian, AuthorAmorim, Antonio, Author more..

Affiliations:
1Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society, ou_159889
2MPI for Extraterrestrial Physics, Max Planck Society, ou_159888

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Language(s): eng - English

Dates: Date issued: 2016

Publication Status: Issued

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Rev. Type: Peer

Identifiers: DOI: 10.1117/12.2232272
Other: LOCALID: 2400200

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Title: Optical and Infrared Interferometry and Imaging V

Place of Event: Edinburgh, UK

Start-/End Date: 2016-06-26 - 2016-06-26

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Title: Optical and Infrared Interferometry and Imaging V

Source Genre: Proceedings

Creator(s):
Malbet, Fabien, Editor
Creech-Eakman, Michelle J., Editor
Tuthill, Peter G., Editor

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Pages: - Volume / Issue: - Sequence Number: 990722 Start / End Page: 1 - 9 Identifier: ISBN: 978-0-5106-0193-2

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Title: Proceedings of SPIE

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Publ. Info: Bellingham, WA, USA : Society of Photo-Optical Instrumentation Engineers

Pages: - Volume / Issue: 9907 Sequence Number: - Start / End Page: - Identifier: ISSN: 0277-786X