Study the effect of electrode biasing on m/n=2/1 tearing mode on the J-TEXT 
tokamak

Hu, Q.; Liu, H.; Chen, Z.; Yu, Q.; Zhu, L.; Cheng, Z.; Zhuang, G.

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Study the effect of electrode biasing on m/n=2/1 tearing mode on the J-TEXT tokamak

Hu, Q., Liu, H., Chen, Z., Yu, Q., Zhu, L., Cheng, Z., et al. (2016). Study the effect of electrode biasing on m/n=2/1 tearing mode on the J-TEXT tokamak. Poster presented at 58th Annual Meeting of the APS Division of Plasma Physics, San Jose, CA.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002C-A2DD-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002C-A2DE-A

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Creators:
Hu, Q.¹, Author
Liu, H.¹, Author
Chen, Z.¹, Author
Yu, Q.², Author
Zhu, L.¹, Author
Cheng, Z.¹, Author
Zhuang, G.¹, Author

Affiliations:
1External Organizations, ou_persistent22
2Tokamak Theory (TOK), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856309

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Language(s): eng - English

Dates: Created: 2017

Publication Status: Not specified

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Title: 58th Annual Meeting of the APS Division of Plasma Physics

Place of Event: San Jose, CA

Start-/End Date: 2016-10-31 - 2016-11-04

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