Sample-thickness dependence and chemical effects in SIMS depth profiling of 
multilayer Langmuir-Blodgett-films

Wittmaack, K.; Laxhuber, L.; Möhwald, Helmuth

doi:10.1016/S0168-583X(86)80102-1

Local TagsRelease HistoryDetailsSummary

Sample-thickness dependence and chemical effects in SIMS depth profiling of multilayer Langmuir-Blodgett-films

Wittmaack, K., Laxhuber, L., & Möhwald, H. (1987). Sample-thickness dependence and chemical effects in SIMS depth profiling of multilayer Langmuir-Blodgett-films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 18(4-6), 639-643. doi:10.1016/S0168-583X(86)80102-1.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-5373-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-5374-A

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Wittmaack, K., Author
Laxhuber, L., Author
Möhwald, Helmuth¹, Author

Affiliations:
1External Organizations, ou_persistent22

Content

show

Details

show

hide

Language(s):

Dates: Date issued: 1987

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: ISI: A1987F933700049
DOI: 10.1016/S0168-583X(86)80102-1

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Abbreviation : NIM B

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: Amsterdam : Elsevier B.V.

Pages: - Volume / Issue: 18 (4-6) Sequence Number: - Start / End Page: 639 - 643 Identifier: ISSN: 0168-583X