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  Robust Two-Dimensional Electronic Properties in Three-Dimensional Microstructures of Rotationally Stacked Turbostratic Graphene

Richter, N., Hernandez, Y. R., Schweitzer, S., Kim, J. S., Patra, A. K., Englert, J., et al. (2017). Robust Two-Dimensional Electronic Properties in Three-Dimensional Microstructures of Rotationally Stacked Turbostratic Graphene. Physical Review Applied, 7(2): 024022. doi:10.1103/PhysRevApplied.7.024022.

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 Creators:
Richter, N., Author
Hernandez, Yenny R.1, Author              
Schweitzer, S., Author
Kim, J. S., Author
Patra, A. K., Author
Englert, J., Author
Lieberwirth, Ingo2, Author              
Liscio, A., Author
Palermo, V., Author
Feng, Xinliang3, Author              
Hirsch, A., Author
Müllen, K.1, Author              
Kläui, M., Author
Affiliations:
1Dept. Müllen: Synthetic Chemistry, MPI for Polymer Research, Max Planck Society, ou_1800289              
2Dept. Landfester: Physical Chemistry of Polymers, MPI for Polymer Research, Max Planck Society, ou_1800288              
3Tech Univ Dresden, D-01069 Dresden, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2017
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1103/PhysRevApplied.7.024022
 Degree: -

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Title: Physical Review Applied
  Abbreviation : Phys. Rev. Appl.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: College Park, Md. [u.a.] : American Physical Society
Pages: - Volume / Issue: 7 (2) Sequence Number: 024022 Start / End Page: - Identifier: ISSN: 2331-7019
CoNE: https://pure.mpg.de/cone/journals/resource/2331-7019