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  Charge transfer quantification in a SnOx/CuPc semiconductor heterostructure: investigation of buried interface energy structure by photoelectron spectroscopies

Krzywiecki, M., Grządziel, L., Sarfraz, A., & Erbe, A. (2017). Charge transfer quantification in a SnOx/CuPc semiconductor heterostructure: investigation of buried interface energy structure by photoelectron spectroscopies. Physical Chemistry Chemical Physics, 19(19), 11816-11824. doi:10.1039/C7CP01688C.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-569B-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-CB4F-5
Genre: Journal Article

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 Creators:
Krzywiecki, Maciej1, 2, Author           
Grządziel, Lucyna1, Author           
Sarfraz, Adnan2, Author           
Erbe, Andreas2, 3, Author           
Affiliations:
1Institute of Physics – CSE, Silesian University of Technology, B. Krzywoustego 2, 44–100 Gliwice, Poland, ou_persistent22              
2Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              
3Department of Materials Science and Engineering, NTNU - Norwegian University of Science and Technology, 7491 Trondheim, Norway, ou_persistent22              

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Language(s): eng - English
 Dates: 2017-05-21
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1039/C7CP01688C
 Degree: -

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Title: Physical Chemistry Chemical Physics
  Abbreviation : Phys. Chem. Chem. Phys.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Cambridge, England : Royal Society of Chemistry
Pages: - Volume / Issue: 19 (19) Sequence Number: - Start / End Page: 11816 - 11824 Identifier: ISSN: 1463-9076
CoNE: https://pure.mpg.de/cone/journals/resource/954925272413_1