The Effect of High Energy Ion Beam Analysis on D Trapping in W

Finlay, T. J.; Davis, J. W.; Schwarz-Selinger, T.; Haasz, A. A.

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The Effect of High Energy Ion Beam Analysis on D Trapping in W

Finlay, T. J., Davis, J. W., Schwarz-Selinger, T., & Haasz, A. A. (2017). The Effect of High Energy Ion Beam Analysis on D Trapping in W. Poster presented at 16th International Conference on Plasma-Facing Materials and Components for Fusion Applications (PFMC-16), Neuss.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-7E7A-6 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-7E7B-4

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Urheber:
Finlay, T. J.¹, Autor
Davis, J. W.¹, Autor
Schwarz-Selinger, T.², Autor
Haasz, A. A.¹, Autor

Affiliations:
1External Organizations, ou_persistent22
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327