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  Correlated and simulated electron microscopy and atom probe tomography

Raabe, D., Gault, B., Yao, M., Scheu, C., Liebscher, C., & Herbig, M. (2017). Correlated and simulated electron microscopy and atom probe tomography. Talk presented at Workshop on Possibilities and Limitations of Quantitative Materials Modeling and Characterization 2017. Bernkastel, Germany. 2017-05-16.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-86A8-1 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-6CEA-F
Genre: Talk

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 Creators:
Raabe, Dierk1, Author              
Gault, Baptiste2, Author              
Yao, Mengji1, Author              
Scheu, Christina3, Author              
Liebscher, Christian4, Author              
Herbig, Michael5, Author              
Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
3Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
4Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
5Materials Science of Mechanical Contacts, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2324693              

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Language(s): eng - English
 Dates: 2017-05-16
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: Workshop on Possibilities and Limitations of Quantitative Materials Modeling and Characterization 2017
Place of Event: Bernkastel, Germany
Start-/End Date: 2017-05-16
Invited: Yes

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