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  Correlative transmission EBSD-APT analysis of grain boundaries in Cu(In,Ga)Se2 and Cu2ZnSnSe4 based thin-film solar cells

Schwarz, T., Stechmann, G., Gault, B., Cojocaru-Mirédin, O., Choi, P.-P., Redinger, A., et al. (2017). Correlative transmission EBSD-APT analysis of grain boundaries in Cu(In,Ga)Se2 and Cu2ZnSnSe4 based thin-film solar cells. Talk presented at Microscopy & Microanalysis. St. Louis, Missouri, USA. 2017-08-06 - 2017-08-10.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-94C5-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-94C6-0
Genre: Talk

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 Creators:
Schwarz, Torsten1, Author              
Stechmann, Guillaume2, Author              
Gault, Baptiste1, Author              
Cojocaru-Mirédin, Oana2, 3, Author              
Choi, Pyuck-Pa4, Author              
Redinger, Alex5, Author              
Siebentritt, Susanne5, Author              
Raabe, Dierk2, Author              
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
3RWTH Aachen, I. Physikalisches Institut IA, Aachen, Germany, ou_persistent22              
4Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea, ou_persistent22              
5University of Luxembourg, Laboratory for Photovoltaics, 41, rue du Brill, L-4422, Belvaux, Luxembourg, ou_persistent22              

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Language(s): eng - English
 Dates: 2017-08
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: Microscopy & Microanalysis
Place of Event: St. Louis, Missouri, USA
Start-/End Date: 2017-08-06 - 2017-08-10

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