Schwarz, T., Stechmann, G., Gault, B., Cojocaru-Mirédin, O., Choi, P.-P., Redinger, A., et al. (2017). Correlative transmission EBSD-APT analysis of grain boundaries in Cu(In,Ga)Se2 and Cu2ZnSnSe4 based thin-film solar cells. Talk presented at Microscopy & Microanalysis. St. Louis, Missouri, USA. 2017-08-06 - 2017-08-10.