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  Insight into CuInS2 thin films by electron microscopy

Frank, A., Wochnik, A. S., & Scheu, C. (2016). Insight into CuInS2 thin films by electron microscopy. Poster presented at European Microscopy Conference (EMC), Lyon, France.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0023-C731-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-6CE3-6
Genre: Poster

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 Creators:
Frank, Anna1, Author              
Wochnik, Angela S.2, Author              
Scheu, Christina3, Author              
Affiliations:
1Nanoanalytics and Interfaces, Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Department of Chemistry, LMU Munich, Germany, ou_persistent22              
3Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              

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Language(s): eng - English
 Dates: 2016
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: European Microscopy Conference (EMC)
Place of Event: Lyon, France
Start-/End Date: 2016-08-28 - 2016-09-02

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