Insight into CuInS2 thin films by electron microscopy

Frank, Anna; Wochnik, Angela S.; Scheu, Christina

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Insight into CuInS₂ thin films by electron microscopy

Frank, A., Wochnik, A. S., & Scheu, C. (2016). Insight into CuInS₂ thin films by electron microscopy. Poster presented at European Microscopy Conference (EMC), Lyon, France.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-C731-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-6CE3-6

Genre: Poster

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Creators:
Frank, Anna¹, Author
Wochnik, Angela S.², Author
Scheu, Christina³, Author

Affiliations:
1Nanoanalytics and Interfaces, Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
2Department of Chemistry, LMU Munich, Germany, ou_persistent22
3Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294

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Language(s): eng - English

Dates: Created: 2016

Publication Status: Not specified

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Title: European Microscopy Conference (EMC)

Place of Event: Lyon, France

Start-/End Date: 2016-08-28 - 2016-09-02

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