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  Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy

Hieke, S. W., Dehm, G., & Scheu, C. (2015). Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. Poster presented at TEM-UCA: Transmission Electron Microscopy of Nanomaterials - European Summer Workshop (TEM-UCA 2015), Cádiz, Spain.

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 Creators:
Hieke, Stefan Werner1, Author           
Dehm, Gerhard2, Author           
Scheu, Christina3, Author           
Affiliations:
1Nanoanalytics and Interfaces, Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              
3Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              

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Language(s): eng - English
 Dates: 2015-07
 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
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Title: TEM-UCA: Transmission Electron Microscopy of Nanomaterials - European Summer Workshop (TEM-UCA 2015)
Place of Event: Cádiz, Spain
Start-/End Date: 2015-07-19 - 2015-07-24

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