Investigation of solid state dewetting phenomena of epitaxial Al thin films on 
sapphire using electron microscopy

Hieke, Stefan Werner; Dehm, Gerhard; Scheu, Christina

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Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy

Hieke, S. W., Dehm, G., & Scheu, C. (2016). Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. Talk presented at The 16th European Microscopy Congress (EMC 2016). Lyon, France. 2016-08-28 - 2016-09-02.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-C731-3 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0001-6CD9-2

Genre: Vortrag

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Urheber:
Hieke, Stefan Werner¹, Autor
Dehm, Gerhard², Autor
Scheu, Christina³, Autor

Affiliations:
1Nanoanalytics and Interfaces, Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398
3Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294