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  Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy

Hieke, S. W., Dehm, G., & Scheu, C. (2016). Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. Talk presented at The 16th European Microscopy Congress (EMC 2016). Lyon, France. 2016-08-28 - 2016-09-02.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0023-C731-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-6CD9-2
Genre: Talk

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 Creators:
Hieke, Stefan Werner1, Author              
Dehm, Gerhard2, Author              
Scheu, Christina3, Author              
Affiliations:
1Nanoanalytics and Interfaces, Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              
3Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              

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Language(s): eng - English
 Dates: 2016
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: The 16th European Microscopy Congress (EMC 2016)
Place of Event: Lyon, France
Start-/End Date: 2016-08-28 - 2016-09-02

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