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  Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT

Liebscher, C., Stoffers, A., Cojocaru-Mirédin, O., Gault, B., Scheu, C., Dehm, G., et al. (2016). Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In Microscopy and Microanalysis (pp. 46-47).

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-AA71-0 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-6C21-1
Genre: Conference Paper

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 Creators:
Liebscher, Christian1, Author              
Stoffers, Andreas2, Author              
Cojocaru-Mirédin, Oana2, Author              
Gault, Baptiste3, Author              
Scheu, Christina4, Author              
Dehm, Gerhard5, Author              
Raabe, Dierk6, Author              
Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
2I. Physikalisches Institut (IA), RWTH Aachen, 52074 Aachen, Germany, persistent22              
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
4Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
5Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              
6Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2016-11
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1017/S1431927616012253
 Degree: -

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Title: 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016)
Place of Event: Saarbrücken, Germany
Start-/End Date: 2016-10-11 - 2016-10-12

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Title: Microscopy and Microanalysis
Source Genre: Proceedings
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Publ. Info: -
Pages: - Volume / Issue: 22 (S5) Sequence Number: - Start / End Page: 46 - 47 Identifier: -