Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by 
Correlative Atomic-Resolution STEM and APT

Liebscher, Christian; Stoffers, Andreas; Cojocaru-Mirédin, Oana; Gault, Baptiste; Scheu, Christina; Dehm, Gerhard; Raabe, Dierk

doi:10.1017/S1431927616012253

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Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT

Liebscher, C., Stoffers, A., Cojocaru-Mirédin, O., Gault, B., Scheu, C., Dehm, G., et al. (2016). Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In Microscopy and Microanalysis (pp. 46-47).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-AA71-0 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-6C21-1

Genre: Conference Paper

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Creators:
Liebscher, Christian¹, Author
Stoffers, Andreas², Author
Cojocaru-Mirédin, Oana², Author
Gault, Baptiste³, Author
Scheu, Christina⁴, Author
Dehm, Gerhard⁵, Author
Raabe, Dierk⁶, Author

Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399
2I. Physikalisches Institut (IA), RWTH Aachen, 52074 Aachen, Germany, persistent22
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
4Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
5Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398
6Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Date issued: 2016-11

Publication Status: Issued

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Identifiers: DOI: 10.1017/S1431927616012253

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Title: 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016)

Place of Event: Saarbrücken, Germany

Start-/End Date: 2016-10-11 - 2016-10-12

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Title: Microscopy and Microanalysis

Source Genre: Proceedings

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Pages: - Volume / Issue: 22 (S5) Sequence Number: - Start / End Page: 46 - 47 Identifier: -