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  Electronic charge rearrangement at metal/organic interfaces induced by weak van der Waals interactions

Ferri, N., Ambrosetti, A., & Tkatchenko, A. (2017). Electronic charge rearrangement at metal/organic interfaces induced by weak van der Waals interactions. Physical Review Materials, 1(2): 026003. doi:10.1103/PhysRevMaterials.1.026003.

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PhysRevMaterials.1.026003.pdf (Verlagsversion), 3MB
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PhysRevMaterials.1.026003.pdf
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2017
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APS
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 Urheber:
Ferri, Nicola1, Autor           
Ambrosetti, Alberto2, Autor           
Tkatchenko, Alexandre1, 3, Autor           
Affiliations:
1Theory, Fritz Haber Institute, Max Planck Society, ou_634547              
2Dipartimento di Fisica e Astronomia, Università degli Studi di Padova, 35131 Padova, Italy, ou_persistent22              
3Physics and Materials Science Research Unit, University of Luxembourg, ou_persistent22              

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 Zusammenfassung: Electronic charge rearrangements at interfaces between organic molecules and solid surfaces play a key role in a wide range of applications in catalysis, light-emitting diodes, single-molecule junctions, molecular sensors and switches, and photovoltaics. It is common to utilize electrostatics and Pauli pushback to control the interface electronic properties, while the ubiquitous van der Waals (vdW) interactions are often considered to have a negligible direct contribution (beyond the obvious structural relaxation). Here, we apply a fully self-consistent Tkatchenko-Scheffler vdW density functional to demonstrate that the weak vdW interactions can induce sizable charge rearrangements at hybrid metal/organic systems (HMOS). The complex vdW correlation potential smears out the interfacial electronic density, thereby reducing the charge transfer in HMOS, changes the interface work functions by up to 0.2 eV, and increases the interface dipole moment by up to 0.3 Debye. Our results suggest that vdW interactions should be considered as an additional control parameter in the design of hybrid interfaces with the desired electronic properties.

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Sprache(n): eng - English
 Datum: 2017-06-142017-05-032017-07-25
 Publikationsstatus: Online veröffentlicht
 Seiten: 8
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: DOI: 10.1103/PhysRevMaterials.1.026003
 Art des Abschluß: -

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Projektname : SMALL - Surfaces for molecular recognition at the atomic level
Grant ID : 238804
Förderprogramm : Funding Programme 7 (FP7)
Förderorganisation : European Commission (EC)

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Titel: Physical Review Materials
  Kurztitel : Phys. Rev. Mat.
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: College Park, MD : American Physical Society
Seiten: 8 Band / Heft: 1 (2) Artikelnummer: 026003 Start- / Endseite: - Identifikator: ISSN: 2475-9953
CoNE: https://pure.mpg.de/cone/journals/resource/2475-9953