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  Highly efficient soft X-ray spectrometer based on a reflection zone plate for resonant inelastic X-ray scattering measurements.

Yin, Z., Rehanek, J., Löchel, H., Braig, C., Buck, J., Firsov, A., et al. (2017). Highly efficient soft X-ray spectrometer based on a reflection zone plate for resonant inelastic X-ray scattering measurements. Optics Express, 25(10), 10984-10996. doi:10.1364/OE.25.010984.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-B89B-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-57C9-B
Genre: Journal Article

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Yin, Z., Author
Rehanek, J., Author
Löchel, H., Author
Braig, C., Author
Buck, J., Author
Firsov, A., Author
Viefhaus, J., Author
Erko, A., Author
Techert, S.1, Author              
Affiliations:
1Research Group of Structural Dynamics of (Bio)Chemical Systems, MPI for biophysical chemistry, Max Planck Society, ou_578564              

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 Abstract: We present a newly designed compact and flexible soft X-ray spectrometer for resonant inelastic X-ray scattering (RIXS) studies within an energy range from 380 eV to 410 eV, which would include the K alpha emission lines of vital elements like nitrogen. We utilized an off-axis reflection zone plate (RZP) as the wavelength selective element with a maximum line density of 10000 l/mm. A higher energy resolution over a broader range of +/- 15 eV around the designed energy was achieved by displacing the RZP. Additionally, for the first time, an actual optical side effect, the so-called comatic aberration was exploited to increase the energy resolution. First results show a resolving power in the order of 1300 for photon energy of 395 eV, which is comparable to a commercial varied line spacing grating (VLS).

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Language(s): eng - English
 Dates: 2017-05-032017-05-15
 Publication Status: Published in print
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 Rev. Method: Peer
 Identifiers: DOI: 10.1364/OE.25.010984
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Title: Optics Express
Source Genre: Journal
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Pages: - Volume / Issue: 25 (10) Sequence Number: - Start / End Page: 10984 - 10996 Identifier: -