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  Nanoscale Stoichiometric Analysis of a High-Temperature Superconductor by Atom Probe Tomography

Pedrazzini, S., London, A. J., Gault, B., Saxey, D. W., Speller, S., Grovenor, C. R. M., et al. (2017). Nanoscale Stoichiometric Analysis of a High-Temperature Superconductor by Atom Probe Tomography. Microscopy and Microanalysis, 23(2), 414-424. doi:10.1017/S1431927616012757.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-C491-7 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-C49B-4
Genre: Journal Article

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 Creators:
Pedrazzini, Stella1, Author              
London, Andrew J.1, Author              
Gault, Baptiste2, 3, Author              
Saxey, David W.4, Author              
Speller, Susannah1, Author              
Grovenor, Chris R. M.1, Author              
Danaie, Mohsen1, Author              
Moody, Michael P.5, Author              
Edmondson, Philip D.6, Author              
Bagot, Paul Alexander J.7, Author              
Affiliations:
1Department of Materials, University of Oxford, Parks Road, , Oxford OX1 3PH, UK, persistent22              
2Department of Materials, University of Oxford, Parks Road, , Oxford OX1 3PH, UK, ou_persistent22              
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
4Advanced Resource Characterisation Facility & John de Laeter Centre, Curtin University, Perth, Western Australia 6102, Australia, ou_persistent22              
5Department of Materials, University of Oxford, Parks Road, Oxford OX13PH, UK, ou_persistent22              
6Oak Ridge National Laboratory, Materials Science & Technology Division, 1 Bethel Valley Road, Oak Ridge, TN 37831, USA, persistent22              
7Department of Materials, University of Oxford, Oxford, UK, ou_persistent22              

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Language(s): eng - English
 Dates: 2017-01-312017-04
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1017/S1431927616012757
 Degree: -

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Title: Microscopy and Microanalysis
  Abbreviation : Microsc. Microanal.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 23 (2) Sequence Number: - Start / End Page: 414 - 424 Identifier: ISSN: 1431-9276
CoNE: /journals/resource/991042731793414