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  Revisiting Field Ion Microscopy

Gault, B., Dagan, M., Katnagallu, S., De Geuser, F., Vurpillot, F., Raabe, D., et al. (2017). Revisiting Field Ion Microscopy. Talk presented at TMS 2017. San Diego, CA, USA. 2017-02-26 - 2017-03-02.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-C597-4 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-EA39-C
Genre: Talk

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 Creators:
Gault, Baptiste1, Author              
Dagan, Michal2, Author              
Katnagallu, Shyam1, Author              
De Geuser, Frédéric3, 4, Author              
Vurpillot, François5, Author              
Raabe, Dierk6, Author              
Moody, Michael P.7, Author              
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH UK, persistent22              
3Université Grenoble Alpes, SIMAP, F-38000 Grenoble, France, persistent22              
4CNRS, SIMAP, F-38000 Grenoble, France, persistent22              
5The Sir William Dunn School of Pathology, University of Oxford, Oxford, UK, persistent22              
6Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
7Department of Materials, University of Oxford, Parks Road, Oxford OX13PH, UK, ou_persistent22              

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Language(s): eng - English
 Dates: 2017
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: TMS 2017
Place of Event: San Diego, CA, USA
Start-/End Date: 2017-02-26 - 2017-03-02
Invited: Yes

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