Synchrotron based µLaue diffraction to probe plasticity at interfaces

Kirchlechner, Christoph

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Synchrotron based µLaue diffraction to probe plasticity at interfaces

Kirchlechner, C. (2016). Synchrotron based µLaue diffraction to probe plasticity at interfaces. Talk presented at IRSP 2016, 14th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics – Experiment and Simulation. Dresden, Germany. 2016-05-30 - 2016-06-01.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-CA58-8 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-0539-9

Genre: Talk

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Creators:
Kirchlechner, Christoph^{1, 2}, Author

Affiliations:
1Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401
2Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22

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Language(s): eng - English

Dates: Created: 2016-06-01

Publication Status: Not specified

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Title: IRSP 2016, 14th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics – Experiment and Simulation

Place of Event: Dresden, Germany

Start-/End Date: 2016-05-30 - 2016-06-01

Invited: Yes

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