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  Microstructure analysis of silicon nanocrystals formed from silicon rich oxide with high excess silicon: Annealing and doping effects

Nomoto, K., Yang, T. C. J., Ceguerra, A. V., Zhang, T., Lin, Z., Breen, A. J., et al. (2017). Microstructure analysis of silicon nanocrystals formed from silicon rich oxide with high excess silicon: Annealing and doping effects. Journal of Applied Physics, 122(2): 025102, pp. 1-9. doi:10.1063/1.4990983.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-E749-2 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-E74A-F
Genre: Journal Article

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 Creators:
Nomoto, Keita1, 2, Author              
Yang, Terry Chien Jen2, Author              
Ceguerra, Anna Vallarta3, Author              
Zhang, Tian2, Author              
Lin, Ziyun2, Author              
Breen, Andrew J.4, Author              
Wu, Liangcai2, Author              
Puthen-Veettil, Binesh2, Author              
Jia, Xuguang5, Author              
Conibeer, Gavin J.2, Author              
van Perez-Wurfl, I.2, Author              
Ringer, Simon P.6, Author              
Affiliations:
1School of Aerospace, Mechanical and Mechatronic Engineering, University of Sydney, Sydney, NSW, Australia, persistent22              
2School of Photovoltaic and Renewable Energy Engineering, University of New South Wales, Sydney, NSW, Australia, persistent22              
3Australian Centre for Microscopy and Microanalysis, School of Aerospace, Mechatronic and Mechanical Engineering, University of Sydney, NSW 2006, Australia, ou_persistent22              
4Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
5School of Materials Science and Engineering, Jiangsu Collaborative Innovation Center of Photovoltaic Science and Engineering, Jiangsu Province Cultivation Base for State Key Laboratory of Photovoltaic Science and Technology, Changzhou University, Changzhou, Jiangsu, China, persistent22              
6Australian Institute for Nanoscale Science and Technology, and School of Aerospace Mechanical and Mechatronic Engineering, The University of Sydney, Australia, ou_persistent22              

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Language(s): eng - English
 Dates: 2017-07-14
 Publication Status: Published in print
 Pages: 9
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1063/1.4990983
 Degree: -

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Title: Journal of Applied Physics
  Abbreviation : J. Appl. Phys.
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 122 (2) Sequence Number: 025102 Start / End Page: 1 - 9 Identifier: ISSN: 0021-8979
CoNE: /journals/resource/991042723401880