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  Thickness dependence of microstructure in thin La0.7Sr0.3MnO3 films grown on (1 0 0) SrTiO3 substrate

Mirzadeh Vaghefi, P., Baghizadeh, A., Willinger, M. G., Pereira, M. J., Mota, D. A., Almeida, B. G., Agostinho Moreira, J., & Amaral, V. S. (2017). Thickness dependence of microstructure in thin La0.7Sr0.3MnO3 films grown on (1 0 0) SrTiO3 substrate. Journal of Physics D, 50(39):. doi:10.1088/1361-6463/aa80bf.

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資料種別: 学術論文

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 作成者:
Mirzadeh Vaghefi, P.1, 著者
Baghizadeh, A.2, 著者
Willinger, Marc Georg3, 著者           
Pereira, M. J.1, 著者
Mota, D. A.4, 著者
Almeida, B. G.5, 著者
Agostinho Moreira, J.4, 著者
Amaral, V. S.1, 著者
所属:
1Department of Physics and CICECO, University of Aveiro, 3810-193 Aveiro, Portugal, ou_persistent22              
2Department of Materials and Ceramic Engineering and CICECO, University of Aveiro, 3810-193 Aveiro, Portugal, ou_persistent22              
3Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
4IFIMUP and IN-institute of Nanosciense and Nanotechnology, Departmento de Fisica e Astronamia de Faculdade de Universidade do Porto, Portugal, ou_persistent22              
5Physics Center and Quantalab, Physics Department, Minho University, Braga, Portugal, ou_persistent22              

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 要旨: This study investigates the nanostructure of perovskite thin films, and its influence on magnetic properties. Epitaxial thin films of perovskite La0.7Sr0.3MnO3 with thickness ranging from 13.5 nm to 320 nm were deposited on SrTiO3 (1 0 0) substrates using pulsed laser deposition techniques. X-ray diffraction, along with high-resolution transmission electron microscopy (HRTEM) investigations were carried out, and showed the presence of a second, La-rich phase in thick film. Scanning electron microscopy analysis showed thinner films to have smooth surfaces, while thicker films presented large triangular shapes emerging out of the film surface. Also HRTEM images revealed epitaxial growth for thinner films. Thicker films grow with numerous misfit dislocations leading to columnar structure, where the thickest film presents branched structure with an intermediate La-rich layer. Lattice mismatch, diffusion of Mn ions into the substrate and substituting Ti ions are known as sources of strain in films near interfaces. Magnetic properties in the structure mentioned are described by double-exchange interaction, which is very sensitive to local structure. Hence, the nanostructure of films reported here has a remarkable effect on their magnetic properties.

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言語: eng - English
 日付: 2017-05-142017-07-192017-09-012017-10-04
 出版の状態: 出版
 ページ: 10
 出版情報: -
 目次: -
 査読: 査読あり
 識別子(DOI, ISBNなど): DOI: 10.1088/1361-6463/aa80bf
 学位: -

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出版物名: Journal of Physics D
  省略形 : J. Phys. D: Appl. Phys.
種別: 学術雑誌
 著者・編者:
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出版社, 出版地: Bristol : IOP Publishing
ページ: 10 巻号: 50 (39) 通巻号: 395301 開始・終了ページ: - 識別子(ISBN, ISSN, DOIなど): ISSN: 0022-3727
CoNE: https://pure.mpg.de/cone/journals/resource/0022-3727