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  Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements

Barty, A., Caleman, C., Aquila, A., Timneanu, N., Lomb, L., White, T. A., et al. (2012). Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements. Nature Photonics, 6(1), 35-40. doi:10.1038/nphoton.2011.297.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-F225-8 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-F226-6
Genre: Journal Article
Alternative Title : Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements

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 Creators:
Barty, Anton, Author
Caleman, Carl, Author
Aquila, Andrew, Author
Timneanu, Nicusor, Author
Lomb, Lukas1, Author
White, Thomas A., Author
Andreasson, Jakob, Author
Arnlund, David, Author
Bajt, Saša, Author
Barends, Thomas1, Author
Barthelmess, Miriam, Author
Bogan, Michael J., Author
Bostedt, Christoph, Author
Bozek, John D., Author
Coffee, Ryan N., Author
Coppola, Nicola, Author
Davidsson, Jan, Author
DePonte, Daniel P., Author
Doak, R. Bruce1, Author
Ekeberg, Tomas, Author
Elser, Veit, AuthorEpp, Sascha2, Author              Erk, Benjamin1, AuthorFleckenstein, Holger, AuthorFoucar, Lutz1, AuthorFromme, Petra, AuthorGraafsma, Heinz, AuthorGumprecht, Lars, AuthorHajdu, Janos, AuthorHampton, Christina Y., AuthorHartmann, Robert, AuthorHartmann, Andreas, AuthorHauser, Günter, AuthorHirsemann, Helmut, AuthorHoll, Peter, AuthorHunter, Mark S., AuthorJohansson, Linda, AuthorKassemeyer, Stephan1, AuthorKimmel, Nils, AuthorKirian, Richard A., AuthorLiang, Mengning, AuthorMaia, Filipe R. N. C., AuthorMalmerberg, Erik, AuthorMarchesini, Stefano, AuthorMartin, Andrew V., AuthorNass, Karol1, AuthorNeutze, Richard, AuthorReich, Christian, AuthorRolles, Daniel1, AuthorRudek, Benedikt1, AuthorRudenko, Artem, AuthorScott, Howard, AuthorSchlichting, Ilme1, AuthorSchulz, Joachim, AuthorSeibert, M. Marvin, AuthorShoeman, Robert L.1, AuthorSierra, Raymond G., AuthorSoltau, Heike, AuthorSpence, John C. H., AuthorStellato, Francesco, AuthorStern, Stephan, AuthorStrüder, Lothar, AuthorUllrich, Joachim, AuthorWang, Xiaoyu, AuthorWeidenspointner, Georg, AuthorWeierstall, Uwe, AuthorWunderer, Cornelia B., AuthorChapman, Henry N., Author more..
Affiliations:
1Department of Biomolecular Mechanisms, Max Planck Institute for Medical Research, Max Planck Society, ou_1497700              
2Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society, ou_2025284              

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 Abstract: X-ray free-electron lasers have enabled new approaches to the structural determination of protein crystals that are too small or radiation-sensitive for conventional analysis1. For sufficiently short pulses, diffraction is collected before significant changes occur to the sample, and it has been predicted that pulses as short as 10 fs may be required to acquire atomic-resolution structural information1-4. Here, we describe a mechanism unique to ultrafast, ultra-intense X-ray experiments that allows structural information to be collected from crystalline samples using high radiation doses without the requirement for the pulse to terminate before the onset of sample damage. Instead, the diffracted X-rays are gated by a rapid loss of crystalline periodicity, producing apparent pulse lengths significantly shorter than the duration of the incident pulse. The shortest apparent pulse lengths occur at the highest resolution, and our measurements indicate that current X-ray free-electron laser technology5 should enable structural determination from submicrometre protein crystals with atomic resolution.

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Language(s): eng - English
 Dates: 2011-07-212011-10-312011-12-182012-01-01
 Publication Status: Published in print
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Degree: -

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Title: Nature Photonics
Source Genre: Journal
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Pages: - Volume / Issue: 6 (1) Sequence Number: - Start / End Page: 35 - 40 Identifier: ISSN: 1749-4885
CoNE: /journals/resource/1000000000240270