Compositional analysis on ensemble of InGaAs fins using TEM and Rutherford 
backscattering spectrometry

Laricchiuta, G.; Vandervorst, W.; Vickridge, I.; Mayer, M.; Favia, P.; Schulze, A.; Meersschaut, J.

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Compositional analysis on ensemble of InGaAs fins using TEM and Rutherford backscattering spectrometry

Laricchiuta, G., Vandervorst, W., Vickridge, I., Mayer, M., Favia, P., Schulze, A., et al. (2017). Compositional analysis on ensemble of InGaAs fins using TEM and Rutherford backscattering spectrometry. Talk presented at 2017 E-MRS Fall Meeting. Warsaw. 2017-09-18 - 2017-09-21.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-F4E7-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-F4E8-2

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Creators:
Laricchiuta, G.¹, Author
Vandervorst, W.¹, Author
Vickridge, I.¹, Author
Mayer, M.², Author
Favia, P.¹, Author
Schulze, A.¹, Author
Meersschaut, J.¹, Author

Affiliations:
1External Organizations, ou_persistent22
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327

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Language(s): eng - English

Dates: Submitted: 2017

Publication Status: Submitted

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Title: 2017 E-MRS Fall Meeting

Place of Event: Warsaw

Start-/End Date: 2017-09-18 - 2017-09-21

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