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  Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy

Hieke, S. W., Dehm, G., & Scheu, C. (2016). Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In European Microscopy Congress 2016: Proceedings (pp. 203-204). Wiley-VCH Verlag GmbH & Co KGaA. doi:10.1002/9783527808465.EMC2016.5892.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002E-059D-1 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-6C00-6
Genre: Conference Paper

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 Creators:
Hieke, Stefan Werner1, Author           
Dehm, Gerhard2, Author           
Scheu, Christina3, Author           
Affiliations:
1Nanoanalytics and Interfaces, Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              
3Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              

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Language(s): eng - English
 Dates: 2016-12-20
 Publication Status: Published online
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1002/9783527808465.EMC2016.5892
 Degree: -

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Title: The 16th European Microscopy Congress (EMC 2016)
Place of Event: Lyon, France
Start-/End Date: 2016-08-28 - 2016-09-02

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Title: European Microscopy Congress 2016: Proceedings
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: Wiley-VCH Verlag GmbH & Co KGaA
Pages: 2 Volume / Issue: - Sequence Number: - Start / End Page: 203 - 204 Identifier: -