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  In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire

Hieke, S. W., Willinger, M. G., Wang, Z.-J., Richter, G., Dehm, G., & Scheu, C. (2017). In situ electron microscopy – insights in solid state dewetting of epitaxial Al thin films on sapphire. In M. Laue (Ed.), Microscopy Conference 2017 (MC 2017) - Proceedings. Regensburg: Universität Regensburg.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002E-059F-E Version Permalink: http://hdl.handle.net/21.11116/0000-0001-6BFF-9
Genre: Conference Paper

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 Creators:
Hieke, Stefan Werner1, Author              
Willinger, Marc Georg2, Author              
Wang, Zhu-Jun2, Author              
Richter, Gunther3, Author              
Dehm, Gerhard4, Author              
Scheu, Christina1, Author              
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
3Dept. Physical Intelligence, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_2054292              
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2017-09-04
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: URN: nbn:de:bvb:355-epub-361434
 Degree: -

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Title: Microscopy Conference 2017 (MC 2017)
Place of Event: Lausanne, Switzerland
Start-/End Date: 2017-08-21 - 2017-08-25

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Title: Microscopy Conference 2017 (MC 2017) - Proceedings
Source Genre: Proceedings
 Creator(s):
Laue, Michael1, Editor
Affiliations:
1 Universität Regensburg, ou_persistent22            
Publ. Info: Regensburg : Universität Regensburg
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: -