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  In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire

Hieke, S. W., Willinger, M. G., Wang, Z.-J., Richter, G., Dehm, G., & Scheu, C. (2017). In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. Talk presented at Microscopy Conference 2017 – Dreiländertagung (MC 2017). Lausanne, Switzerland. 2017-08-21 - 2017-08-25.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002E-05B8-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-6BFC-C
Genre: Talk

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 Creators:
Hieke, Stefan Werner1, Author              
Willinger, Marc Georg2, Author              
Wang, Zhu-Jun2, Author              
Richter, Gunther3, Author              
Dehm, Gerhard4, Author              
Scheu, Christina1, Author              
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
3Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              
4Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2017-08-22
 Publication Status: Not specified
 Pages: -
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Title: Microscopy Conference 2017 – Dreiländertagung (MC 2017)
Place of Event: Lausanne, Switzerland
Start-/End Date: 2017-08-21 - 2017-08-25

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