Hieke, S. W., Willinger, M. G., Wang, Z.-J., Richter, G., Dehm, G., & Scheu, C. U. (2017). In-situ electron microscopy: Insights in solid state dewetting of epitaxial Al thin films on sapphire. Talk presented at Microscopy Conference 2017 – Dreiländertagung (MC 2017). Lausanne, Switzerland. 2017-08-21 - 2017-08-25.