Bias and synergy in the self-consistent analysis of IBA data

Silva, T. F.; Rodrigues, C. L.; Mayer, M.; Toussaint, U. von

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Bias and synergy in the self-consistent analysis of IBA data

Silva, T. F., Rodrigues, C. L., Mayer, M., & Toussaint, U. v. (2017). Bias and synergy in the self-consistent analysis of IBA data. Talk presented at 23rd International Conference on Ion Beam Analysis (IBA 2017). Shanghai. 2017-10-08 - 2017-10-13.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002E-02E3-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002E-02E4-4

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Creators:
Silva, T. F.¹, Author
Rodrigues, C. L.¹, Author
Mayer, M.², Author
Toussaint, U. von³, Author

Affiliations:
1External Organizations, ou_persistent22
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327
3Numerical Methods in Plasma Physics (NMPP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856344

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Language(s): eng - English

Dates: Submitted: 2017

Publication Status: Submitted

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Title: 23rd International Conference on Ion Beam Analysis (IBA 2017)

Place of Event: Shanghai

Start-/End Date: 2017-10-08 - 2017-10-13

Invited: Yes

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