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  On the Multiple Event Detection in Atom Probe Tomography

Peng, Z., Gault, B., & Raabe, D. (2017). On the Multiple Event Detection in Atom Probe Tomography. Talk presented at Microscopy & Microanalysis 2017 Conference. St. Louis, MO, USA. 2017-08-06 - 2017-08-10.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002E-062E-4 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002E-062F-2
Genre: Talk

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 Creators:
Peng, Zirong1, Author              
Gault, Baptiste2, Author              
Raabe, Dierk1, Author              
Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              

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Language(s): eng - English
 Dates: 2017-08
 Publication Status: Not specified
 Pages: -
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 Rev. Method: -
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Title: Microscopy & Microanalysis 2017 Conference
Place of Event: St. Louis, MO, USA
Start-/End Date: 2017-08-06 - 2017-08-10

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