Lifetime limitations in organic electronic devices due to metal electrochemical 
migration

Abbel, R.; van de Peppel, L.; Kirchner, G.; Michels, Jasper J.; Groen, P.

doi:10.1557/mrc.2017.46

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Lifetime limitations in organic electronic devices due to metal electrochemical migration

Abbel, R., van de Peppel, L., Kirchner, G., Michels, J. J., & Groen, P. (2017). Lifetime limitations in organic electronic devices due to metal electrochemical migration. MRS Communications, 7(3), 664-671. doi:10.1557/mrc.2017.46.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002E-0FE3-B Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002E-0FE4-9

Genre: Journal Article

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Abbel, R., Author
van de Peppel, L., Author
Kirchner, G., Author
Michels, Jasper J.¹, Author
Groen, P., Author

Affiliations:
1Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society, ou_1800284

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Language(s): eng - English

Dates: Published in Print: 2017

Publication Status: Published in print

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Identifiers: DOI: 10.1557/mrc.2017.46

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Title: MRS Communications

Source Genre: Journal

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Publ. Info: New York : Cambridge University Press

Pages: - Volume / Issue: 7 (3) Sequence Number: - Start / End Page: 664 - 671 Identifier: ISSN: 2159-6859
CoNE: https://pure.mpg.de/cone/journals/resource/2159-6859