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  Bulk and surface electronic properties of SmB6: A hard x-ray photoelectron spectroscopy study

Utsumi, Y., Kasinathan, D., Ko, K.-T., Agrestini, S., Haverkort, M. W., Wirth, S., et al. (2017). Bulk and surface electronic properties of SmB6: A hard x-ray photoelectron spectroscopy study. Physical Review B, 96(15): 155130, pp. 1-10. doi:10.1103/PhysRevB.96.155130.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002E-2685-B Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002E-268A-1
Genre: Journal Article

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 Creators:
Utsumi, Y.1, Author              
Kasinathan, D.1, Author              
Ko, K.-T.2, Author              
Agrestini, S.3, Author              
Haverkort, M. W.4, Author              
Wirth, S.5, Author              
Wu, Y-H.6, Author
Tsuei, K-D.6, Author
Kim, D-J.6, Author
Fisk, Z.6, Author
Tanaka, A.6, Author
Thalmeier, P.7, Author              
Tjeng, L. H.8, Author              
Affiliations:
1Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863445              
2Kyung-Tae Ko, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863451              
3Stefano Agrestini, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863459              
4Maurits Haverkort, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863455              
5Steffen Wirth, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863460              
6external, ou_persistent22              
7Peter Thalmeier, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863457              
8Liu Hao Tjeng, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863452              

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 Abstract: We have carried out bulk-sensitive hard x-ray photoelectron spectroscopy measurements on in situ cleaved and ex situ polished SmB6 single crystals. Using the multiplet structure in the Sm 3d core level spectra, we determined reliably that the valence of Sm in bulk SmB6 is close to 2.55 at similar to 5 K. Temperature dependent measurements revealed that the Sm valence gradually increases to 2.64 at 300 K. From a detailed line shape analysis we can clearly observe that not only the J = 0 but also the J = 1 state of the Sm 4f(6) configuration becomes occupied at elevated temperatures. Making use of the polarization dependence, we were able to identify and extract the Sm 4f spectral weight of the bulk material. Finally, we revealed that the oxidized or chemically damaged surface region of the ex situ polished SmB6 single crystal is surprisingly thin, about 1 nm only.

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Language(s): eng - English
 Dates: 2017-10-182017-10-18
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
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Title: Physical Review B
  Abbreviation : Phys. Rev. B
Source Genre: Journal
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Publ. Info: Woodbury, NY : American Physical Society
Pages: - Volume / Issue: 96 (15) Sequence Number: 155130 Start / End Page: 1 - 10 Identifier: ISSN: 1098-0121
CoNE: https://pure.mpg.de/cone/journals/resource/954925225008