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  Fokussierte Ionenstrahl-Technik (FIB) in der Mikro- und Nanomechanik

Motz, C., Kiener, D., Schöberl, T., Pippan, R., & Dehm, G. (2005). Fokussierte Ionenstrahl-Technik (FIB) in der Mikro- und Nanomechanik. In W. Rom (Ed.), Handbuch der Nanoanalytik Steiermark, NanoNet Styria (1, pp. 1-311). Graz, Austria: W. Rom.

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 Creators:
Motz, Christian1, Author           
Kiener, Daniel2, Author           
Schöberl, Thomas3, Author           
Pippan, Reinhard4, Author           
Dehm, Gerhard1, 5, Author           
Affiliations:
1Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
2Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Austria, ou_persistent22              
3Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, A-8700 Leoben, Austria, ou_persistent22              
4Erich Schmid Institute of Materials Science, Austrian Academy of Sciences and Department Material Physics, Leoben, Austria, ou_persistent22              
5Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              

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 Dates: 2005
 Publication Status: Issued
 Pages: 2
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: Handbuch der Nanoanalytik Steiermark, NanoNet Styria
Source Genre: Book
 Creator(s):
Rom, Werner1, Editor
Affiliations:
1 Technische Universität Graz Forschungsinstitut für Elektronenmikroskopie und Feinstrukturforschung, Zentrum für Elektronenmikroskopie Graz, ou_persistent22            
Publ. Info: Graz, Austria : W. Rom, 1
Pages: 311 Volume / Issue: - Sequence Number: - Start / End Page: 1 - 311 Identifier: -