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キーワード:
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要旨:
A novel o-axis gun (OAG) with its cathode displaced from the central axis, which
is therefore free of any obstacles, was built into a compact room temperature
electron beam ion trap (EBIT). The chosen geometry of the gun grants optical
access to trap center along the beam axis, where highly charged ions can be used
as a new in situ calibration standard for high energy photon beams as provided
e.g. by ultra brilliant radiation sources like synchrotrons and free electron lasers.
First measurements of dielectronic recombinations on argon and iron ions have
shown stable operations of the OAG with a 25mA electron beam and up to 8 keV
beam energy. A high energy beam resolution of 2:6(1) eV could be achieved using
low beam currents.
