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  Robust reconstruction of time-resolved diffraction from ultrafast streak cameras

Badali, D. S., & Miller, R. J. D. (2017). Robust reconstruction of time-resolved diffraction from ultrafast streak cameras. Structural Dynamics, 4(5): 054302. doi:10.1063/1.4985059.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002E-96BF-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0004-93E7-1
Genre: Journal Article

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2017
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https://dx.doi.org/10.1063/1.4985059 (Publisher version)
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 Creators:
Badali, Daniel S.1, 2, Author              
Miller, R. J. Dwayne1, 2, 3, Author              
Affiliations:
1Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_1938288              
2The Hamburg Centre for Ultrafast Imaging, ou_persistent22              
3Departments of Chemistry and Physics, University of Toronto, Toronto, Ontario M5S 1H6, Canada, ou_persistent22              

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Free keywords: X-ray diffraction; Image reconstruction; Cameras; Image sensors; Data analysis
 Abstract: In conjunction with ultrafast diffraction, streak cameras offer an unprecedented opportunity for recording an entire molecular movie with a single probe pulse. This is an attractive alternative to conventional pump-probe experiments and opens the door to studying irreversible dynamics. However, due to the “smearing” of the diffraction pattern across the detector, the streaking technique has thus far been limited to simple mono-crystalline samples and extreme care has been taken to avoid overlapping diffraction spots. In this article, this limitation is addressed by developing a general theory of streaking of time-dependent diffraction patterns. Understanding the underlying physics of this process leads to the development of an algorithm based on Bayesian analysis to reconstruct the time evolution of the two-dimensional diffraction pattern from a single streaked image. It is demonstrated that this approach works on diffraction peaks that overlap when streaked, which not only removes the necessity of carefully choosing the streaking direction but also extends the streaking technique to be able to study polycrystalline samples and materials with complex crystalline structures. Furthermore, it is shown that the conventional analysis of streaked diffraction can lead to erroneous interpretations of the data.

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Language(s): eng - English
 Dates: 2017-05-012017-06-01
 Publication Status: Published online
 Pages: 15
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1063/1.4985059
 Degree: -

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Title: Structural Dynamics
Source Genre: Journal
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Publ. Info: Melville, NY : American Institute of Physics
Pages: 15 Volume / Issue: 4 (5) Sequence Number: 054302 Start / End Page: - Identifier: Other: 2329-7778
CoNE: /journals/resource/2329-7778