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  Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers

Wiedorn, M. O., Awel, S., Morgan, A. J., Barthelmess, M., Bean, R., Beyerlein, K. R., et al. (2017). Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers. Journal of Synchrotron Radiation, 24, 1296-1298. doi:10.1107/S1600577517011961.

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 Urheber:
Wiedorn, Max O.1, Autor
Awel, Salah1, Autor
Morgan, Andrew J.1, Autor
Barthelmess, Miriam1, Autor
Bean, Richard1, Autor
Beyerlein, Kenneth R.1, Autor
Chavas, Leonard M. G.1, Autor
Eckerskorn, Niko1, Autor
Fleckenstein, Holger1, Autor
Heymann, Michael2, Autor           
Horke, Daniel A.1, Autor
Knoska, Juraj1, Autor
Mariani, Valerio1, Autor
Oberthuer, Dominik1, Autor
Roth, Nils1, Autor
Yefanov, Oleksandr1, Autor
Barty, Anton1, Autor
Bajt, Sasa1, Autor
Kuepper, Jochen1, Autor
Rode, Andrei V.1, Autor
Kirian, Richard A.1, AutorChapman, Henry N.1, Autor mehr..
Affiliations:
1external, ou_persistent22              
2Schwille, Petra / Cellular and Molecular Biophysics, Max Planck Institute of Biochemistry, Max Planck Society, ou_1565169              

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Schlagwörter: SCATTERINGInstruments & Instrumentation; Optics; Physics; X-ray diffraction; single-particle imaging; coherent diffractive imaging; aperture; background scattering; signal-to-noise ratio;
 Zusammenfassung: The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.

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Sprache(n): eng - English
 Datum: 2017-11
 Publikationsstatus: Erschienen
 Seiten: 3
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: ISI: 000414172900019
DOI: 10.1107/S1600577517011961
 Art des Abschluß: -

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Titel: Journal of Synchrotron Radiation
  Kurztitel : J. Synchrotron Radiat.
  Andere : JSR
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: Copenhagen, Denmark : Published for the International Union of Crystallography by Munksgaard
Seiten: - Band / Heft: 24 Artikelnummer: - Start- / Endseite: 1296 - 1298 Identifikator: ISSN: 0909-0495
ISSN: 1600-5775
CoNE: https://pure.mpg.de/cone/journals/resource/954925562624