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  Comparative analysis of impulse and impedance tests to detect short circuits within the W7-X magnets

Ehmler, H., Baldzuhn, J., Rummel, T., Riße, K., Fillunger, H., Maix, R., et al. (2005). Comparative analysis of impulse and impedance tests to detect short circuits within the W7-X magnets. Poster presented at 19th International Conference on Magnet Technology (MT 19), Genova.

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Ehmler.pdf (Any fulltext), 270KB
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 Creators:
Ehmler, H.1, Author           
Baldzuhn, J.1, Author           
Rummel, T.2, 3, Author           
Riße, K.3, Author           
Fillunger, H.4, Author
Maix, R.4, Author
Jeckle, A.4, Author
Parodi, S.4, Author
Scheller, H.4, Author
Affiliations:
1W7-X: Basic Device, Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856315              
2W7-X: Operations (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856342              
3W7-X: Construction, Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856314              
4Technical University Wien, Atominstitut, Austria; ABB Service AG, Augsburg; ASG, Ansaldo Superconduttori, Genova, Italy; BNN, Babcock Noell Nuclear, Würzburg, ou_persistent22              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Identifiers: eDoc: 244863
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Title: 19th International Conference on Magnet Technology (MT 19)
Place of Event: Genova
Start-/End Date: 2005-09-18 - 2005-09-23

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